The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
May. 18, 2000
Applicant:
Inventors:
Alex Ballantyne, Edinburgh, GB;
David Taylor, Edinburgh, GB;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/700 ;
U.S. Cl.
CPC ...
H04B 1/700 ;
Abstract
An electronic system parameter, such as time deviation (TDEV), is measured by reference to an input series of data samples received and processed to produce in real-time first and second time-varying series of measurements for the parameter.
Ballantyne, Alex. (2004). Method and apparatus for measuring parameters of an electrical system (U.S. Patent No. 6741641). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6741641
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