The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
May. 01, 2000
Applicant:
Inventors:
Eiji Ishihara, Tokyo, JP;
Shinsuke Hiraoka, Kanagawa, JP;
Yuji Ikegami, Kanagawa, JP;
Takashi Mizusawa, Kanagawa, JP;
Tozaburo Nishimura, Kanagawa, JP;
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/100 ; G02B 2/118 ;
U.S. Cl.
CPC ...
G02B 2/100 ; G02B 2/118 ;
Abstract
There is provided a three-dimensional object observing microscope which can easily observe a three-dimensional object in a three-dimensional manner. A three-dimensional object observing microscope comprising a table on which a three-dimensional object is placed, an imaging part which consists of an imaging lens and an imaging camera for imaging this three-dimensional object from an inclined upper position, and a casing which supports the imaging part rotatably in a horizontal direction and also integrally supports the table and the imaging part.