The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6741077 B1

PDF
Full Text
Expired
Date of Patent:
May. 25, 2004

Filed:

Apr. 25, 2002
Applicant:
Inventors:

Hidekatsu Yokoyama, Koriyama, JP;

Tateaki Ogata, Yonezawa, JP;

Tadaaki Tsuchiya, Yonezawa, JP;

Ryosuke Kudo, Yonezawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

Disclosed are a method of measuring ESR in a sample located outside a resonator using the B leaking to the exterior from the end of the resonator; and an ESR device comprised of at least a resonator capable of applying a B leaking from the end of the resonator to a sample located outside the resonator, and a magnet located on the resonator side of a plane containing the end of the resonator that is capable of applying a B and a modulation field. These inventions enable ESR measurement of the interior of large samples.


Find Patent Forward Citations

Yokoyama, Hidekatsu. (2004). Electron spin resonance measurement method and measurement device for measuring esr within the interior of large samples (U.S. Patent No. 6741077). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6741077

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