The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2004

Filed:

Oct. 09, 2001
Applicant:
Inventors:

Ann Witvrouw, Herent, BE;

Atze de Vries, Leuven, BE;

Piet De Moor, Linden-Lubbeek, BE;

Luc Haspeslagh, Lubbeek-Linden, BE;

Brigitte Parmentier, Leuven, BE;

Agnes Verbist, Winksele-Herent, BE;

Constantine Anagnostopoulos, Mendon, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/144 ; H01L 2/166 ;
U.S. Cl.
CPC ...
H01L 2/144 ; H01L 2/166 ;
Abstract

The present invention is related to a method for producing micromachined devices for use in Microelectromechanical Systems (MEMS), comprising the steps of providing a crystalline wafer, and processing from said wafer at least one micromachined device comprising at least one elongated opening and/or cavity, having a longitudinal axis, so that said longitudinal axis is at an angle to a direction which lies along the intersection of the front plane of the wafer and a cleavage plane, said cleavage plane being defined as a plane along which cleavage of the wafer is most likely to occur.


Find Patent Forward Citations

Loading…