The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2004

Filed:

Nov. 14, 2002
Applicant:
Inventors:

Joerg Sabczynski, Norderstedt, DE;

Waldemar Zylka, Herten, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/800 ;
U.S. Cl.
CPC ...
G01D 1/800 ;
Abstract

A description is given of a method and a device for the calibration of an image pick-up device which is sensitive to gravity. Also described are a method and a device for imaging by means of such an image pick-up device; they are used in particular in X-ray systems, for example, systems provided with a C-arm. Calibration is performed essentially by forming and storing a look-up table whereby the calibration data required for the correction of distortions due to the supporting construction is associated with a plurality of position data of the supporting construction. During imaging the direction of the force of gravity relative to the supporting construction is measured; therefrom the position data is calculated and the calibration data associated with this data in the table is read out and used for the correction of the acquired image.


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