The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2004
Filed:
Apr. 10, 2001
John J. Williams, Hartland, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
An x-ray alignment and measurement process including an x-ray source and a detection array. The detection array allows for the taking of images having a precisely known pixel size and location. Disposed between the x-ray source and the detection array is an object having a known size or position. The object is then imaged and the location and size of the object on the image can be determined and compared to the actual size or location. The calculation is performed on the multiple pixels in the image to mathematically determine the remaining unknown object location or size. For alignment purposes, any error in the location or size of the object can thus be corrected.