The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

May. 03, 2000
Applicant:
Inventor:

Li-Huan Jen, Santa Clara, CA (US);

Assignee:

Zoran Corp., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/300 ;
U.S. Cl.
CPC ...
H03M 1/300 ;
Abstract

A method and system are disclosed for counting errors occurring within an optical compact disk system as data is read from an optically encoded compact disk. In a preferred embodiment error flag data are generated as errors occur within the optical compact disk system. From the error flag data, error flag bits corresponding to errors in reading information from an optically encoded disk are identified for further processing. Further processing includes, among other things, keeping a total count of errors, keeping a count of single occurring errors, keeping a count of multiple occurring errors. Furthermore, by keeping error count information, the operation of the optical compact disk system may be interrupted upon the exceeding of a predetermined threshold. From the error count information the hardware, software and firmware within the optical compact disk system is optimized for increased performance.


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