The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2004
Filed:
Feb. 01, 2001
Wei-Lien Hsu, Austin, TX (US);
Travis Wheatly, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method of quantizing multiple input values in parallel using SIMD instructions is disclosed. In one embodiment, the method comprises (1) receiving a set of input values Xi; (2) operating on the set of input values to produce a set of binary mask values Ki that are related to the input values Xi by Ki=−1 if Xi>0, and Ki=0 if Xi<0; (3) adding half of a quantization step Q to the input values Xi to obtain sum values; (4) subtracting half of a quantization step Q to the input values Xi to obtain difference values; (5) using the binary mask values to screen out sum values calculated from negative input values; (6) using a complementary binary mask to screen out difference values calculated from positive input values; and (7) combining the screened sum and difference values to determine prequantization values Yi that can be expressed Yi=Xi+Q/2 if Xi>0, and Yi=Xi−Q/2 if Xi≦0. The prequantization values may then be converted to floating point format, divided by Q, and restored to integer format to obtain the desired quantization values. Each of these operations can be performed in parallel on each of the values in the set using SIMD instructions.