The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Jun. 02, 2000
Applicant:
Inventors:

William Coleman, Mountain View, CA (US);

Michael A. Tanner, Hayward, CA (US);

Christopher M. Silva, Sunnyvale, CA (US);

Edward Bylina, San Jose, CA (US);

Steven J. Robles, San Jose, CA (US);

Michael R. Dilworth, Santa Cruz, CA (US);

Douglas C. Youvan, San Jose, CA (US);

Mary M. Yang, San Jose, CA (US);

Assignee:

Kairos Scientific, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/46 ; G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/46 ; G06K 9/36 ;
Abstract

The present invention provides an instrument and methods for a multispectral optical technique that can simultaneously classify individual biological cells within mixed populations. This invention, known as Multispectral Taxonomic Identification (MTID), shows that microscopy can be combined with a software analysis program to measure and categorize the fluorescence and other spectroscopically identifiable signals from complex populations of cells in situ, without cultivation. The invention thus enables high-throughput screening of cells for taxonomic classification.


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