The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2004
Filed:
Aug. 26, 2002
Isaac N. Bankman, Columbia, MD (US);
Lloyd W. Ison, Salt Lake City, UT (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
The invention is a method and apparatus for automated detection of small structures in images. One specific use is to detect malignant microcalcification clusters in mammograms. A digitized and filtered mammogram image is stored in a computer. Seed pixels, which are pixels that are brighter than their immediate neighbors, are identified to indicate candidate structures and used to construct two regions. Various features are then measured using the two regions around each seed point. The features characterize each candidate structure and are input to a classifier, such as a neural network. The classifier then distinguishes between structures of interest and background. The structures detected by the classifier are then presented to a clustering algorithm. A detected structure that is less than a threshold distance away from the nearest structure and a cluster is included in that cluster. Finally, the results are displayed, either on a monitor or on hard copy, with a frame around the detected cluster.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile