The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

May. 30, 2000
Applicant:
Inventor:

Richard C. Van Hall, Owego, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/34 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/34 ;
Abstract

A binarization method for gray address images which combines high quality and high speed. The method is designed specifically for efficient software implementation. Two binarization approaches, localized background thresholds and Laplacian edge enhancement, are combined into a process to enhance the strengths of the two methods and eliminate their weaknesses. The image is divided into tiles, making binarization decisions for each tile. Tile decisions are modified based on adjacent tile decisions and then the tiles are binarized. Binarization of pixels is performed by performing background thresholding and edge detection thresholding. Only pixels exceeding both thresholds are selected as “on”.


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