The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2004
Filed:
Sep. 05, 2001
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A method for examining a specimen ( ) by means of a confocal scanning microscope having at least one light source ( ), preferably a laser, to generate an illuminating light beam ( ) for the specimen ( ), and a beam deflection device ( ) to guide the illuminating light beam ( ) over the specimen ( ) comprises the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen ( ) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen ( ) is detected.