The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

May. 06, 2002
Applicant:
Inventors:

Robert H. Benner, Gaithersburg, MD (US);

Kevin W. Baugh, Gaithersburg, MD (US);

Assignee:

Lockheed Martin Corporation, Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/02 ;
U.S. Cl.
CPC ...
G01S 3/02 ;
Abstract

A system and method for detection and feature extraction in a passive coherent location system is disclosed. During a coherent processing interval, detection and feature extraction operations are performed to determine peak detections and target parameters for targets. The system forms an ambiguity surface that has ambiguity surface data or the coherent processing interval. Bins from a previous ambiguity surface are associated with the ambiguity surface data. New bins are identified for new target echoes within the ambiguity surface. Peak detections are formed from the bins. The peak detections correlate to the target echoes of the coherent processing interval. Target parameters for the targets are estimated from the peak detections.


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