The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Jan. 22, 2002
Applicant:
Inventors:

Hiroshi Sakayori, Sagamihara, JP;

Takanori Komuro, Tokyo, JP;

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract

An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver , an integrator for being supplied with an analog signal outputted from the adder or subtractor , a switch for selectively transmitting an analog signal outputted from the integrator and a digital signal outputted from the integrated circuit to the comparator , and a switch for selectively transmitting a signal outputted from a memory and a signal outputted from a comparator to the driver . At least one of the switches is operated depending on whether a signal to be tested is analog or digital.


Find Patent Forward Citations

Loading…