The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Jun. 21, 2002
Applicant:
Inventor:

Morgan T. Johnson, Portland, OR (US);

Assignee:

Morgan Labs, LLC, Portland, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

Methods and apparatus are provided for I/O pads of unsingulated integrated circuits, to be connected to electrical equipment. A translator plate is interposed between a wafer and tester. The translator plate includes a substrate having two major opposing surfaces, each surface having terminals disposed thereon, and electrical pathways disposed through the substrate to provide for electrical continuity between at least one terminal on a first surface and at least one terminal on the second surface. The translator plate, when interposed between wafer and tester, makes electrical contact with one or more I/O pads of a plurality of integrated circuits on the wafer, providing an electrical pathway therethrough. An anisotropic conductor is disposed between the wafer and the translator plate. A vibratory mechanism, oriented to provide substantially horizontal vibratory motion to the wafer, may be coupled to the wafer to assist disposing the translator plate and anisotropic conductor over the wafer.


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