The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Aug. 30, 2002
Applicant:
Inventors:

Stephen P. Shaffer, West Hills, CA (US);

John C. Bretney, Yorba Linda, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/100 ;
U.S. Cl.
CPC ...
G01B 1/100 ;
Abstract

An optical alignment system for controlling the position of a laser beam through an optical train. The optical alignment system includes a semiconductor laser source for the generation of an alignment beam, and a beam steering device to manipulate the position of the alignment beam on a multi-element detector. The semiconductor laser is driven to mode hop at a frequency greater than the upper frequency limit of the multi-element detector. Driving the semiconductor laser to mode hop at a frequency greater than the upper frequency limit of the multi-element detector results in a more uniform alignment beam as seen by the detector, as the alignment beam becomes an average of all the operational modes of the semiconductor laser. A more uniform alignment beam results in improved accuracy of the alignment system.


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