The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Jun. 27, 2002
Applicant:
Inventor:

Thierry Ducourant, Voiron, FR;

Assignee:

Trixell, Moirans, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 ;
U.S. Cl.
CPC ...
G01T 1/24 ;
Abstract

A method and device for temperature compensation of an image detector including photosensitive spots sensitive to ambient temperature, each connected to a row conductor and a column conductor. The photosensitive spots are connected by their conductors to a read circuit. The photosensitive spots are divided into detecting photosensitive spots to be exposed to light information corresponding to the image to be detected, the read circuits associated with these photosensitive spots each delivering a measurement voltage representative of the image to be detected, and into blind photosensitive spots protected from the light information, the read circuits associated with these blind photosensitive spots each delivering a dark voltage serving for temperature compensation. During detection of an image the dark voltages are picked up, then an average correction value from the dark voltages coming from one or more detected images is generated, and the average correction value is used to generate a correction voltage to be applied, during detection of a subsequent image, to the read circuits associated with the detecting photosensitive spots so that they deliver a measurement voltage made substantially independent of temperature. Such a method and device may find application in particular to radiological image detectors.


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