The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2004

Filed:

Apr. 25, 2002
Applicant:
Inventors:

Jean Muller, Ariege, FR;

Pierre Le Brun, Saint Jean de Soudain, FR;

Thierry Odievre, Coublevie, FR;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/902 ;
U.S. Cl.
CPC ...
G01N 2/902 ;
Abstract

Process and apparatus for displaying, measuring the size of and counting individual inclusions in suspension in moving liquid metal using an ultrasound sensor including emission and reception devices. Using the emission device, a series of ultrasound beam pulses is emitted within the liquid metal, and echoes reflected by the inclusions are received using the reception device. The reflected echoes are successively acquired and processed, and displayed as images which are analyzed to count and measure the diameter of inclusions. The sensor is calibrated by selectively placing in a path defined by the beam pulses at least one control reflector having predetermined dimensions and a geometry stable over time, successively acquiring and processing reflected echoes from the control reflector, displaying the reflected echoes from the control reflector as images, and analyzing the control reflector echo images to determine a relationship between amplitude of the images and the control reflector dimensions.


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