The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Jul. 06, 2000
Applicant:
Inventors:

Robert Francis Berry, Austin, TX (US);

Riaz Y. Hussain, Austin, TX (US);

Frank Eliot Levine, Austin, TX (US);

Robert J. Urquhart, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 ;
U.S. Cl.
CPC ...
G06F 9/44 ;
Abstract

The value of non-discrete metric variables are synchronized at the processor level. When the profiler requests metric information for non-discrete metric variables, the operating system kernel obtains a global value for the requested metric rather than obtaining per-processor metric values for each processor. The global value may be written to trace records. By using a single global per-processor metric for all processors, a single global value of the last metric variable may be used for calculating the resources consumed on all processors since a last recorded event.


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