The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Oct. 31, 2000
Applicant:
Inventors:

Hideo Fujiwara, Kyoto, JP;

Toshimitsu Masuzawa, Hyogo, JP;

Satoshi Ohtake, Ikoma, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

A test controller has a test plan generating unit for generating a test plan of a data path which is formed to have a fixed control testability in which a test plan constituted by three phases, that is, the propagation of a test vector to a data input, the execution of a test and the propagation of an output response is present for each test object module. Thus, an integrated circuit is capable of supplying a test plan as a time series of a control signal to a control input of a data path, shortening a test execution time and generating the test plan at the normal operation speed of the circuit, thereby carrying out a test at an actual operation speed and an integrated circuit designing method.


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