The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

May. 08, 2001
Applicant:
Inventors:

Naoyuki Tokuda, Tokyo, JP;

Liang Chen, Tokyo, JP;

Hiroyuki Sasai, Tokyo, JP;

Assignee:

SunFlare Co., Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 ; G06N 7/02 ; G06N 7/06 ;
U.S. Cl.
CPC ...
G06F 9/44 ; G06N 7/02 ; G06N 7/06 ;
Abstract

A method of automatically generating a multi-variable fuzzy inference system using a Fourier series expansion. Sample sets are decomposed into a cluster of sample sets associated with given input variables. Fuzzy rules and membership functions are computed individually for each variable by solving a single input multiple outputs fuzzy system extracted from the set cluster. The resulting fuzzy rules and membership functions are composed and integrated back into the fuzzy system appropriate for the original sample set with a minimal computational cost. In addition, an overall system error can be related to errors at each stage of decomposition and composition, enabling error bounds or accuracy thresholds for each stage to be specified and ensuring the final precision of the resulting fuzzy system on the original sample set.


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