The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Oct. 15, 1999
Applicant:
Inventors:

Javier Castellar, Santa Clara, CA (US);

Luis A. Barcena, Sunnyvale, CA (US);

Ignacio Sanz-Pastor, San Francisco, CA (US);

William P. McGovern, Sunnyvale, CA (US);

Assignee:

Aechelon Technology, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G 7/48 ;
U.S. Cl.
CPC ...
G06G 7/48 ;
Abstract

A set of specially-configured LUT's are used in a rasterizing portion of a graphics system for simulating Sensor-assisted Perception of Terrain (SaPOT) so that simulation of the image produced by a given sensor can proceed rapidly and with good accuracy at a per-texel level of resolution. More specifically, terrain texels-defining memory is provided with a plurality of addressable texel records where each record contains: (a) one or more material identification fields (MID's); (b) one or more mixture fields (MIX's) for defining mixture proportions for the materials; and (c) slope-defining data for defining a surface slope or normal of the corresponding texel. A sky-map LUT is provided for simulating the act of looking up to the sky along the normal surface vector of a given texel to thereby obtain a reading of the sky's contribution of illumination to that terrain texel. A reflectance LUT is provided for simulating the act of reflecting filtered radiation (light) off the material surface of the given terrain texel to thereby obtain a reading of the amount of light that the surface of the texel will reflect. The reflectance and sky contribution factors are multiplied to obtain a per-texel signal representing the amount sensor-detectable light produced from each terrain texel. A generally similar approach is taken to determine what amount of sensor-detectable, black body radiation will be produced from each terrain texel. Each terrain texel is simulated as having a specifiable mixture of plural surface materials. Each terrain texel is allowed to be shadowed during different times and the per-texel shadowing is accounted for.


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