The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Jan. 15, 2002
Applicant:
Inventors:

Richard A. Weekley, Boulder, CO (US);

Robert K. Goodrich, Boulder, CO (US);

Lawrence B. Cornman, Longmont, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/500 ; F06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/500 ; F06F 1/730 ;
Abstract

A processing system uses image processing technology to classify features in time series data. In atmospheric applications, the features can be used to detect outliers and/or failure modes in time series data from atmospheric measurement systems. The processing system is configured to: 1) process the time series data with a plurality of membership functions to generate a plurality of hypersurfaces, 2) process the hypersurfaces to generate a composite hypersurface, 3) process the composite hypersurface to identify clusters, and 4) process the clusters to classify the features.


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