The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

May. 10, 2000
Applicant:
Inventors:

Arty Srivastava, Santa Clara, CA (US);

Michael W. Ritter, Los Altos, CA (US);

Robert J. Friday, Los Gatos, CA (US);

Assignee:

Ricochet Networks, Inc., Denver, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/228 ;
U.S. Cl.
CPC ...
H04L 1/228 ;
Abstract

In an imperfect mesh network or in a star network, the directionality of transmission and reception at each node, as through a directional antenna, is selected to maximize combined or multiple-link end-to-end information throughput. To this end, a maximum throughput metric is provided for separate links through the network between a source node and a collection of end-point nodes to be optimized which is based on 1) measurement of link quality with respect to neighboring nodes and 2) information about link quality and other factors related to propagation delay or “latency” as reported to it by other nodes regarding their neighboring links, and 3) based upon the busy-ness or capacity utilization at each link.


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