The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2004
Filed:
Sep. 14, 2000
Nicholas B. MacKinnon, Vancouver, CA;
Ulrich Stange, Vancouver, CA;
Tidal Photonics, Inc., Vancouver, CA;
Abstract
A test and measurement system to assess performance characteristics of an endoscope or other optically based diagnostic or treatment devices. The performance characteristics can include the photometric characteristics, the imaging characteristics and the physical characteristics of the structural elements including mechanical, pneumatic and fluidic systems. The system comprises software and related devices for calibrating the measurement devices, collecting and controlling measurements, analyzing measurements and comparing them to established performance criteria. The system also analyzes previous measurements and provides analysis and reports to assess trends and plan for replacement or servicing.