The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

May. 05, 1998
Applicant:
Inventors:

Lawrence L. Hause, Waukesha, WI (US);

Dean Jeutter, Grafton, WI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A mapping method for producing an infra-red map utilizing IR coatings on substrates such as microscope slides. The invisible map can be used for positioning a microscope platform or for locating microscopic objects without interference from visible or ultraviolet light.


Find Patent Forward Citations

Hause, Lawrence. (2004). Mapping method for a microscope slide (U.S. Patent No. 6734442). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6734442

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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