The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Oct. 26, 2001
Applicant:
Inventors:

Masashi Ogawa, Tokyo, JP;

Masatoshi Takahashi, Kanagawa, JP;

Kazuko Hanai, Kanagawa, JP;

Hiroshi Arakatsu, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/44 ; G01N 1/28 ;
U.S. Cl.
CPC ...
G01N 1/44 ; G01N 1/28 ;
Abstract

An object of the present invention is to provide a method which comprises adhering a biological sample to a film, cutting out a target area of the sample, and then peeling off the film to collect the fragment which was cut out, wherein the operability is good and a cutting sharpness in cutting by a laser beam is good. The present invention provides a method for cutting a biological sample by light irradiation, which comprises locating the biological sample and a colored film having a thickness of 3 to 6 &mgr;m onto one side of a support, and irradiating the biological sample with a light beam, thereby cutting out a target area of the biological sample.


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