The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2004

Filed:

Nov. 19, 2001
Applicant:
Inventors:

Joseph Lai, Brookfield, WI (US);

Lawrence A. Buyan, Greenfield, WI (US);

Renee S. DuBore, Wauwatosa, WI (US);

Brian Lewis Pate, Tampa, FL (US);

James L. Reuss, Waukesha, WI (US);

Assignee:

Criticare Systems, Inc., Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

The invention relates to a medical parameter monitoring device which allows the monitoring of a plurality of medical parameters from a remote location. The invention uses a central monitoring system which transmits and receives date parameters via RF from remote patient monitors. The monitoring system utilized a digital spread spectrum RF transceiver between the central monitoring system to the remote monitors. Forward error correcting, frequency hopping, and spread sprectrum communications are employed to provide accurate transmission of data for a plurality of physiological parameters. Transmitted data can be automatically registered into storage in the central monitoring system.


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