The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2004
Filed:
Mar. 26, 2002
Toshifumi Masaki, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An aligning method for an ophthalmologic apparatus including a measurement optical system for measuring the eyes of an object to be examined and an illumination system for illuminating the eyes with extrinsic eye light is disclosed. When a reflected cornea image can be detected by irradiating an eye of the object with alignment light, alignment of the measurement optical system is executed on the basis of the reflected cornea image. If no reflected cornea image of the alignment light can be detected, a reflected cornea image formed by the extrinsic eye light is detected, and alignment of the measurement optical system is executed on the basis of the reflected cornea image formed by the extrinsic eye light. Thereafter, the reflected cornea image is detected again.