The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
May. 23, 2002
Applicant:
Inventors:
Dean T. Lindsay, Milpitas, CA (US);
Wayne C. Ashby, San Jose, CA (US);
David A. Plettner, Cupertino, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
Disclosed is a method and device for creating probe masks. In one embodiment, the mask aids in locating and accessing a pad on a PCB to allow for the measurement a signal at the pad using a probe. The mask is a perforated insulating sheet having holes corresponding to the spacing of at least some of the conductive pads on the PCB, and at least some of the holes are marked to aid in signal measurement. A processing system is used to assist in creating the markings.