The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2004

Filed:

May. 31, 2001
Applicant:
Inventors:

Jean-Max Vally, San Francisco, CA (US);

Laura S. Diamondstone, San Francisco, CA (US);

Jon Hartlaub, Mountain View, CA (US);

E. Gregory Lee, Alto, CA (US);

Steven Shafer, Mountain View, CA (US);

Assignee:

Pharsight Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

Methods of performing temporal logic queries, and systems for performing temporal logic queries, are disclosed. Data associated with statistical reliability criteria are annotated in a data source. Baseline data stored in the data source is summarized. Temporal data requests made upon the data source are automatically merged with the data associated with the statistical reliability criteria, to produce a statistically valid data query. Data query results are optionally provided to a statistics module for processing of statistical analyses.


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