The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Apr. 27, 2001
Aliza Rivka Heching, Bronx, NY (US);
Ying Tat Leung, Tarrytown, NY (US);
Menachem Levanoni, Yorktown Heights, NY (US);
Gyana R. Parija, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer method for providing optimization for manufacturing processes for situations wherein there is defined a functional form y=f(x,b), where x comprises a set of independent controllable variables x={x1, . . . xn}, b comprises a set of functional parameters b={b1, . . . bm}, and y comprises a dependent uncontrollable manufacturing variable, f(x,b) subject to constraints on the dependent uncontrollable manufacturing variable y. The method comprises the steps of converting the constraints on y to constraints on b by using a functional estimate of y and its manufacturing variables (parameters) b; optimizing the function f(x,b) subject to the converted constraints on its manufacturing variables (parameters) b; and generating from step (ii) a set of optimized values of b which can optimize the dependent manufacturing variable y.