The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2004

Filed:

Mar. 15, 2002
Applicant:
Inventors:

Mitsuhiro Abe, Kanagawa-ken, JP;

Kenta Kaneeda, Kanagawa-ken, JP;

Hiroo Ota, Kanagawa-ken, JP;

Hideo Niki, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract

A semiconductor memory includes a group of memory cells arrayed in a matrix, memory cell electric power source lines configured to connect the respective memory cells arrayed in a direction of rows of the group of memory cells of each of the rows, two electric power source terminals configured to be mutually independent, and switches configured to be connected between the memory cell electric power source lines and the two electric power source terminals respectively, to be controlled to turn ON/OFF by a inversion logic operation based on a test mode switching signal for switching to and from a test mode and a normal operation mode, and to connect the memory cell power source line to either of the two electric power source terminals according to the ON/OFF control.


Find Patent Forward Citations

Abe, Mitsuhiro. (2004). Semiconductor memory and method of testing semiconductor memory (U.S. Patent No. 6731561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6731561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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