The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Dec. 18, 2001
Seok Ho Kim, Seoul, KR;
Sam Yong Chung, Seoul, KR;
Song Soo Han, Seoul, KR;
Sang Heon Lee, Yongin-si, KR;
Bum Jae You, Seoul, KR;
Sang Rok Oh, Seoul, KR;
Mee Seub Lim, Seoul, KR;
Samsung Corporation, Seoul, KR;
Abstract
The present invention discloses a displacement measurement marker capable of measuring displacement of an object moving on a plane by using a line scan camera, and a displacement measurement method using the same. The displacement measurement marker according to the present invention comprises a plurality of repeatedly arranged figures having the same size and shape. Each of the figures is measurable by means of the line scan camera and is asymmetric with respect to a direction of a scan line of the line scan camera. Preferably, each of the figures is a right-angled triangle of which base is a horizontal line. According to the present invention, there are advantages in that a two-dimensional planar motion of the object can be measured from one-dimensional linear image data, and the motion of the object which moves at a high speed or on which an impact is exerted can be accurately measured.