The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Aug. 31, 2001
Method of measuring surface plasmon resonance using interference structure of reflected beam profile
Henry J. Simon, Sylvania, OH (US);
Robert T. Deck, Toledo, OH (US);
Richard V. Andaloro, Toledo, OH (US);
The University of Toledo, Toledo, OH (US);
Abstract
Changes in optical properties of layered materials are measured by directing an incident wave of finite transverse dimensions toward layered materials under conditions that will produce a propagating surface mode or a waveguide mode in the layered materials. The intensity distribution is measured within the transverse beam profile of the total reflected beam. The profile shows asymmetric structure associated with the excitation of the propagating surface mode or a wave-guide mode. The index of refraction of the layered materials is modified and the reshaped intensity distribution within the transverse beam profile of the total reflected beam is again measured under the same incidence conditions. The measured intensity distributions are compared to detect differences in the indexes of refraction in the layered materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile