The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Nov. 15, 2002
Mark O'Leary, San Diego, CA (US);
Applied Micro Circuits Corporation, San Diego, CA (US);
Abstract
An integrated device having a transimpedance amplifier (TIA) cascaded with a limiter can be tested such that the frequency response of the TIA is accurately measured. The frequency response of the TIA is derived from the measured output jitter response of the integrated TIA/limiter device. In a practical testing system, a sinusoidal test signal having a constant amplitude is combined with a broadband noise signal having a constant power level to obtain a noisy test signal. The TIA/limiter is driven by the noisy test signal while the frequency of the test signal is varied. The output jitter of the TIA/limiter is measured for a number of frequency settings to obtain the output jitter response.