The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Sep. 27, 2001
Maurice Alexander Hugo Donners, Eindhoven, NL;
Koninklijke Philips Electronics N.V, Eindhoven, NL;
Abstract
The invention relates to a device ( ) for testing a series of contacts (Cij), which are provided with connection conductors (G, H) for supplying electric current to the contacts (Cij). The known device is less suitable for testing large numbers of contacts (Cij), at least because it is expensive and the testing operation is tedious. A device ( ) according to the invention includes a (semiconductor) body ( ) on which the contacts (Cij) are present in the form of an array (A) , connection conductors (G, H) which are provided with a selection device. (S) enabling maximally two contacts (C , C ′) to be selected, the connection conductors (G, H) being formed within maximally two separate metal layers ( ). Such a device ( ) is inexpensive and easy to manufacture, and it also enables a large number of contacts (Cij) to be (semi-) quantitatively tested at a high speed. In one embodiment, the selection devices (S) are formed by diodes (D) in a matrix of a limited number of connection conductors (G, H) , enabling only one pair of contacts (C , C ′) to be tested. In another embodiment, the selection means (S) are formed by series-connected capacitors Zij and inductors Lij, enabling each contact (C ) to be individually tested within a network N.