The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Aug. 30, 2002
Jiangang G. Sun, Westmont, IL (US);
Scott M. Erdman, Palos Hills, IL (US);
The University of Chicago, Chicago, IL (US);
Abstract
A method and infrared thermal imaging apparatus detects normal and angled cracks on or beneath a sample surface using infrared thermal imaging where the crack plane is perpendicular or angled to an imaged surface of the sample. A constant heating source is used for heating a section of the sample to produce a lateral heat transfer through the sample. An infrared camera is positioned near one side of the sample for receiving thermal image data resulting from the lateral heat transfer through the sample. A data acquisition and processing computer is used for acquiring and differentiation processing thermal image data from the infrared camera for generating two-dimensional first derivative and second derivative images to detect the normal and angled cracks.