The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2004

Filed:

Dec. 30, 2002
Applicant:
Inventor:

Richard Norman, Sutton, CA;

Assignee:

Hyperchip Inc., Montréal, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ; H01L 2/348 ;
U.S. Cl.
CPC ...
H01L 2/100 ; H01L 2/348 ;
Abstract

A substrate is provided with a plurality of regions, at least one of which is operationally redundant. An integrated circuit to be placed onto the substrate has a plurality of functional units that are designed to be interchangeable. The integrated circuit is tested for defects and, if a functional unit is found to be defective, then the integrated circuit is oriented (e.g., rotated or translated) with respect to the substrate such that the defective functional unit overlies the operationally redundant region of the substrate. A functional association is then formed between the remaining regions of the substrate and the non-defective functional units of the integrated circuit. Such functional association may be achieved by connecting each pair of unit and region. In this way, an integrated circuit with defective functional unit need not be discarded.


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