The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Jun. 23, 2000
Nobumitsu Hori, Ichinomiya, JP;
Yasuo Niino, Aichi-ken, JP;
Toshiaki Naya, Aichi-ken, JP;
Yuji Sasaki, Kariya, JP;
Toyoda Koki Kabushiki Kaisha, Kariya, JP;
Abstract
An apparatus for measuring a circularity deviation of a cylinder of an object intended to be integrally rotated about a rotation axis, the cylinder being eccentric as either intended or not with the rotation axis, the apparatus includes a measuring device, a motion controlling mechanism, and a circularity deviation calculating device. The measuring device is adapted to measure a circumferential surface of the cylinder at each measuring point “p” thereon in a three-point contact method. The motion controlling mechanism is configured to permit the measuring device to be moved along a circumference of the cylinder, which circumference lays on a cross section of the cylinder perpendicular to the rotation axis, in contact with the circumferential surface of the cylinder, during rotation of the cylinder about the rotation axis. The circularity deviation calculating device is designed to calculate the circularity deviation of the cylinder, on the basis of a relative position “x” of the rotation axis relative to the apparatus for measuring the circularity deviation, a rotating angle &phgr; of the cylinder about the rotation axis, and an output “y” of the measuring device.