The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2004
Filed:
Jun. 03, 2002
Alexander M. McQueen, Eugene, OR (US);
Craig D. Cherry, Eugene, OR (US);
Randy J. Turkal, St. Clairsville, OH (US);
PSC Scanning, Inc., Eugene, OR (US);
Abstract
A scanner system and method for improving the capture rate of reading labels with add-ons without sacrificing throughput with respect to non-add-on labels, the scanner including a mode in which the scanner “learns” over time which base label codes will have associated add-ons. At first, the required number of reads of base label information is set to a programmable number that is very low, and is preferably one. As the scanner successfully reads both a base label and its add-on data, the base label data is stored in a list in the scanner's memory and the required number of reads of this particular base label is increased to a second programmable number which is higher than the first and preferably high enough to obtain a reasonable add-on capture rate. Future scans of a base label corresponding to that of one in the list store will result in additional read attempts to ensure the capture of add-on information while the initial low number of reads remains in tact with respect to non-add-on labels. Thus, first pass read rate is preserved where possible and throughput is optimized. Base label statistics on successful base label and associated add-on reads, as well as ordering and selective storage of base label information based on frequency of base label occurrence may also be provided to further optimize performance while reducing system requirements.