The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2004

Filed:

Jun. 29, 2001
Applicant:
Inventors:

Qiang Wan, Bellevue, WA (US);

James Boorn, Maple Valley, WA (US);

Ping Luo, Woodinville, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract

A system and method for processing movement/delta metric data are provided. A processing system obtains one or more data records including movement/delta metric data. The processing system filters the data records according to a regular identification and time key filters and generates a match table and a time-filtered records table. The match table contains data records matching both queries and the time-filtered records table contains data records matching the regular identification key filters but not the time key filters. The processing system merges the match table with the time-filtered records table to generate an aggregated multi-dimensional grid display.


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