The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2004

Filed:

Mar. 01, 2002
Applicant:
Inventors:

Hiroyuki Adachi, Tsuchiurashi, JP;

Toichi Hirata, Ushikushi, JP;

Genroku Sugiyama, Ibaraki, JP;

Hiroshi Watanabe, Ushikushi, JP;

Shuichi Miura, Koshigayashi, JP;

Koji Mitsuya, Kashiwashi, JP;

Yoshiaki Saito, Adachi-ku, JP;

Atsushi Sato, Soukashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06R 1/900 ; G06R 7/70 ; G06G 7/00 ; G06G 7/76 ;
U.S. Cl.
CPC ...
G06R 1/900 ; G06R 7/70 ; G06G 7/00 ; G06G 7/76 ;
Abstract

A method for outputting failure handling method includes: detecting conditions of each part of a working machine; transmitting condition signals representing the detected conditions; receiving the condition signals; calculating a handling method for a failure showed by the received condition signals; and transmitting a handling signal representing the calculated handling method.


Find Patent Forward Citations

Adachi, Hiroyuki. (2004). Failure measure outputting method, output system, and output device (U.S. Patent No. 6728619). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6728619

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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