The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2004

Filed:

Aug. 02, 2000
Applicant:
Inventors:

Jae Gark Choi, Daejon-Shi, KR;

Mun Churl Kim, Daejon-Shi, KR;

Myoung Ho Lee, Daejon-Shi, KR;

Chie Teuk Ahn, Daejon-Shi, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/60 ;
U.S. Cl.
CPC ...
G06K 9/60 ;
Abstract

The present invention provides the method of extracting temporal and spatial combination markers including the steps of: (1) simplifying inputted current image frames, quantizing the simplified images, and then extracting spatial markers from the simplified and quantized image frames using spatial information; (2) extracting temporal markers from inputted current image frames and previous image frames using temporal information, and (3) combining the extracted spatial marker and the extracted temporal marker to extract temporal and spatial markers.


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