The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
Dec. 23, 1999
Ryuichi Hara, Fujiyoshida, JP;
Taro Arimatsu, Yamanashi, JP;
Fanuc Ltd., Yamanashi, JP;
Abstract
There is provided a measurement device being capable of obtaining an image being free from a distortion even if the position of a measurement object varies in image pickup and being capable of performing a precise measurement according to the image. Camera calibration is executed by using a dot pattern or the like, and parameters of a camera model are stored (S ). The image of a reference object is fetched (S ), a corrected reference image being free from a lens distortion and a distortion caused by image pickup in a diagonal direction is formed on the basis of the equation of the camera model (S ), and parameters for detecting the measurement object are set in accordance with the image (S ). In a system operation, the image of the measurement object, the position of which varies, is acquired (S ), and the corrected reference image being free from a distortion as in S is formed (S ). The measurement object is detected by using the parameters for detecting the measurement object (S , S ), necessary data for an application is formed and output (S ). In failure to perform detection, an appropriate message is output (S , S ).