The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
Jul. 25, 2000
Hirohiko Kazato, Tokyo, JP;
Tomoki Hosoi, Tokyo, JP;
Yamatake Corporation, Tokyo, JP;
Abstract
An image input section obtains a halftone image IG of a to-be-measured particle group. A binarization section binarizes the halftone image IT to obtain a binary image IB. A distance transform section performs distance transform for the binary image IB to obtain a distance-transformed image ID. In this case, the particle nucleus extraction section obtains particle nucleus candidates from the distance-transformed image ID and extracts a particle nucleus on the basis of the distance between the particle nucleus candidates and a separation parameter PS to obtain a particle nucleus image IC. A particle expansion section performs particle expansion processing for the particle nucleus image IC and distance-transformed image ID to obtain a particle-separated image IS. In this case, the particle expansion section performs particle expansion processing for the particle nucleus in the particle nucleus image IC along the value of distance transform to obtain the particle-separated image IS. A particle is recognized from the particle-separated image IS. In this way, a particle is recognized at a high speed and high accuracy.