The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
Feb. 14, 2000
Applicant:
Inventors:
Jian-Feng Chen, Issaquah, WA (US);
Jin Kim, Bellevue, WA (US);
Assignee:
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
Method of dynamically measuring movement of objects is disclosed which uses image processing. In a first step a sequence of images is received and stored. Then, at least a first and second reference point within a first image is determined and identification areas around those reference points are defined. Within a sequential image a search area around the predefined reference points which best match the identification area is searched to determine the displacement of the reference point.