The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
Dec. 03, 1999
Jianxin Wu, Mahwah, NJ (US);
Gregory P. Skinger, Southbury, CT (US);
Jason Wang, New City, NY (US);
James Recktenwalt, Mahwah, NJ (US);
United Parcel Service of America, Inc., Atlanta, GA (US);
Abstract
A multi-resolution label locator system divides an input image into a plurality of multi-pixel cells. The multi-resolution label locator system then creates a decimated image or low resolution image corresponding to the input image. The decimated image includes a common-characteristic value that corresponds to a multi-pixel cell of the input image. The multi-resolution label locator system identifies one or more areas within the decimated image that have characteristics corresponding to the characteristics of interest. While generating the decimated image, the multi-resolution label locator system simultaneously creates an edge-occurrence image that corresponds to the input image. The edge-occurrence image includes an edge value that corresponds to each cell of the input image. Each edge value represents the number of occurrences of an edge within the pixels of a corresponding cell of the input image. The multi-resolution label locator system identifies one or more candidate areas within the input image that have decimated-image characteristics and edge-occurrence image characteristics corresponding to the characteristics of interest. The multi-resolution label locator system then classifies the candidate areas according to the likelihood of the input image containing indicia having the characteristics of interest. Lastly, the multi-resolution label locator system compiles a list of one or more candidate areas that most likely contain indicia having the characteristics of interest.