The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2004

Filed:

Feb. 10, 2000
Applicant:
Inventors:

John Hemmings, Beds, GB;

Yasunori Narukawa, London, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M 1/04 ;
U.S. Cl.
CPC ...
H04M 1/04 ;
Abstract

A method of scanning an original image containing image information of different types using a CCD sensor comprising three first linear arrays of photosites sensitive to respective colors. A second linear array of photosites is provided, the pitch between adjacent photosites of the second linear array being different from the pitch between adjacent photosites of the first array. The method comprises causing relative scanning movement between a CCD sensor and the original image while the original image is illuminated, the CCD sensor including at least one first linear array of photosites, and a second linear array of photosites, the pitch between adjacent is photosites of the second linear array being different from the pitch between adjacent photosites of the or each first array monitoring output signals from the at least one first linear array when the at least one first linear array is scanned over a first type of image information: and monitoring output signals from the second linear array when the second linear array is scanned over a second type of image information.


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