The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2004
Filed:
May. 28, 1999
Applicant:
Inventor:
Kaneji Yamada, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/9393 ;
U.S. Cl.
CPC ...
B41J 2/9393 ;
Abstract
A plurality of dot pattern formation is performed for each of a plurality of print elements. By overlaying or contacting a plurality of dots printed by the plurality of formation, a density value of a dot pattern formed on a printing medium is increased, and a test pattern whose area is enlarged is formed.
Yamada, Kaneji. (2004). Printing apparatus and test pattern printing method (U.S. Patent No. 6726302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6726302
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile